Abstract
The electron-beam wobbling method of expanding the vertical exposure are of synchrotron light has been investigated. Displacement and tilt angle of the stored beam caused by a steering magnet were measured using a silicon photodiode array with a compact electron storage ring. It was demonstrated that the experimental results agreed well with theoretical calculations. The effects of electron-beam wobbling on the stored beam were also examined. As a result, it was confirmed that even at a displacement of +or-5-6 mm, which corresponds to a value actually suitable for the stored beam, the tune shift was extremely small and there was no disturbance of the stable conditions of the stored beam. Furthermore, an effective method of simultaneous exposure at every beamline is also discussed.
Published Version
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