Abstract
The orientation of the tilted magnetic anisotropy has crucial importance in many spintronic devices. However, it is very challenging to determine it especially in very small structures produced by lithography. Here, we propose a new experimental method to directly and accurately measure both the polar and azimuthal angles of a tilted magnetic anisotropy. By using the proposed experimental method, we have successfully determined the out-of-plane and in-plane angles of the tilted magnetic anisotropy in a micro-structured multilayer thin film. The orientation of the tilted magnetic anisotropy in the sample has also been confirmed by the theoretical simulations proving the accuracy of the method.
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