Experimental and numerical analysis of sum frequency microscopic images of a H‐Si(111) 1 × 1 surface after IR light pulse irradiation

Abstract

AbstractIn this study, we have observed sum frequency (SF) images of a HSi(111) surface after IR light irradiation of pulse width ∼6 µs, and power from 11 to 13 mJ/pulse. After the IR light pulse irradiation, nonresonant SF signals appeared in the irradiated area. The width of the area emitting the nonresonant SF signal was sensitive to the power of IR light pulses. We compared the profile of the SF signal with that of the calculated hydrogen deficiency by using laser‐induced thermal desorption (LITD) model. The profiles of the calculated hydrogen deficiency were consistent with those of the observed nonresonant SF signal qualitatively. Copyright © 2010 John Wiley & Sons, Ltd.