Abstract
Selected area electron diffraction pattern (SADP) and transmission electron microscopy (TEM) measurements were carried out to investigate the spontaneously ordered structure in Cd x Zn 1− x Te epilayers grown on GaAs (100) substrates. The SADP showed superstructure reflections with symmetrical intensity, and the high-resolution TEM (HRTEM) micrographs showed doublet periodicity in the contrast of the {100} lattice planes. The results of the SADP and the HRTEM measurements showed a Cu 3Au-type ordered structure was formed in the Cd x Zn 1− x Te epilayer. The present results can help improve understanding of the Cu 3Au-type ordered structures in Cd x Zn 1− x Te epilayers grown on GaAs substrates.
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