Excitation and characterization of dielectric-loaded surface plasmon-polariton waveguides at telecommunication wavelengths

Abstract

The excitation of surface plasmon-polariton (SPP) waveguide modes in 500-nm-wide and 550-nm-high dielectric ridges deposited on a thin gold film is characterized at telecommunication wavelengths, by application of a scanning near-field optical microscope (SNOM), and by utilizing the finite element method (FEM). Different tapering structures for coupling in SPPs, excited at the bare gold-air interface, are investigated with a SNOM, and the dependence of in coupling efficiency on tapering length is characterized by means of FEM calculations. The performance of this in coupling method is compared to an alternative excitation scheme, where the effective index of SPPs in the tapering region is matched to the index of the incident beam, thereby exciting SPPs directly in the dielectric tapering structure. Single-mode guiding and strong lateral mode confinement of dielectric-loaded SPP waveguide (DLSPPW) modes are demonstrated by characterizing a straight DLSPPW section with a SNOM and with the effective index method (EIM). The propagation loss of DLSPPW modes is characterized for different wavelengths in the telecommunication region, by application of a SNOM, and the results are compared to EIM calculations.