Abstract
The exchange anisotropy in a Ni 81Fe 19 film sputtered on a (1 0 0) NiO single-crystal substrate is investigated with MOKE magnetometry, ferromagnetic resonance (FMR) and Brillouin light scattering (BLS). The dependencies of the spin-wave frequency and FMR resonance field with the angle of the in-plane field are strikingly different than in polycrystalline samples. The BLS and FMR data are interpreted with a model that includes a planar domain wall in the AF substrate while the exchange field in the single-crystal sample is quite larger than in NiFe films on polycrystalline NiO layers, the domain wall field is smaller.
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