Abstract
The stability of charges trapped by the single‐contact and repeated‐contact modes with atomic force microscopy (AFM) probe for polystyrene/cruciformed spiro [fluorene‐9,9′‐xanthene] (PS/SFXs) electret films is detected by Kelvin probe force microscopy (KPFM). The influences of the contact duration and number of contacts on the trapped charges are explored. We found that the contact duration and number of contacts are important factors to improve the trapping property. The repeated contacts between the AFM probe and the sample are a promising way to improve the stability of trapped charges in PS/SFXs. The possible mechanisms for improving storage properties are also discussed.
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