Abstract

This paper is a summary of some of the recent activities of our soft X-ray spectroscopy collaboration. We are using soft X-ray emission spectroscopy to probe the electronic properties of matter, emphasizing atoms in the bulk and at interfaces. In particular we have used incoherent photon excitation to obtain a basic understanding of the electronic properties of a wide variety of materials including Sr 2RuO 4, a new superconductor. In this first copperless perovskite superconductor, we confirmed in-plane oxygen–ruthenium bonding by analysis using calculations and soft X-ray emission spectroscopy and photoelectron spectroscopy. In the case of the sulfides, the sulfur in FeCuS occupies a single site, and the sulfur in CuS forms dimers at two thirds of the sites. This behavior was confirmed by calculation and by measurement of soft X-ray emission spectra excited at different photon energies near the sulfur L 2,3 absorption edge, and by core photoemission measurements. Measurements of this type illustrate the importance of combining SXE and PES measurements with theoretical calculations. The ubiquitous presence of Raman scattering near the 3d and 4d ionization thresholds has been used to elucidate the excitation process in a number of rare earth and transition metal compounds. Such scattering can produce dramatic changes in the emission spectrum that can further the basic understanding of the atomic excitation process in these compounds. Photon-in photon-out soft X-ray spectroscopy is adding a new dimension to soft X-ray spectroscopy by providing many opportunities for exciting research, especially at third generation synchrotron light sources.

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