Abstract
Abstract The quality of technical surfaces depends significantly on the resource structures of the semi-finished product. To confirm the impact of the crystalline composition on the measuring results of scattered light technology we suggest in this article on the example of aluminium to put the measuring results in relation to the micro properties via metallographic preparation and microscopy. The main goal is to be able to determine the grain size by scattered light technology. The results determined show that a coarse grain test during an in-situ examination of aluminium is possible. The measuring method also offers the potential for the surface examination of other types of material.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call