Evolution of the Helium-Related Defect in Polycrystalline Tungsten

Abstract

The evolution of the helium-related defect in polycrystalline tungsten was studied by Doppler Broadening Positron Annihilation Spectroscopy and Scanning Electron Microscope as functions of annealing temperature and implantation fluence. The experimental results showed that the defect type was not changed at lower annealing temperature, and the decline of S parameter manifested that the lower temperature annealing led the decrease of defect concentration. In addition there existed the same defect type with the increment of the implantation fluence, thus the rise of S parameter implied the increase of the defect concentration.