Abstract
The complementary resistive switching (CRS) characteristics using an IrOx/GdOx/Al2O3/TiN single cell are observed whereas the bipolar resistive switching (BRS) characteristics are observed for the IrOx/GdOx/TiN structure. Transmission electron microscope and energy dispersive X-ray spectroscopy depth profile show crystalline GdOx film and the presence of higher amount of oxygen at both IrOx/GdOx interface and Al2O3 layer. Inserting thin Al2O3 layer, the BRS is changed to CRS. This CRS has hopping distance of 0.58 nm and Poole-Frenkel current conductions for the “0” and “1” states, respectively. A schematic model using oxygen vacancy filament formation/rupture at the TE/GdOx interface and Al2O3 layer has been illustrated. This CRS device has good endurance of 1000 cycles with a pulse width of 1 μs, which is very useful for future crossbar architecture.
Highlights
TiN single cell are observed whereas the bipolar resistive switching
characteristics are observed for the IrOx
the bipolar resistive switching (BRS) is changed to complementary resistive switching (CRS)
Summary
The complementary resistive switching (CRS) characteristics using an IrOx/GdOx/Al2O3/TiN single cell are observed whereas the bipolar resistive switching (BRS) characteristics are observed for the IrOx/GdOx/TiN structure.
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