Abstract
This study aimed to evaluate a prototype surface reaction-type pre-reacted glass-ionomer (S-PRG) filler-containing endodontic sealer (S-PRG sealer) in terms of its ion-releasing ability and the incorporation of the released ions by root canal dentin. The concentration of ions in the set S-PRG sealer was measured by ICPS and with a fluoride ion electrode. Element mapping and chemical component bulk analysis of the outermost dentin of the S-PRG sealer-dentin interface were performed by SEM-EPMA. The incorporation depth of the elements in dentin was measured by element line scanning. Ions released from the S-PRG sealer (Al, B, F, Na, Si, Sr, and Zn) were detected over time. The incorporation of fluoride (F), strontium (Sr), silicon (Si), and boron (B) was observed along the outermost dentin of the S-PRG sealer-dentin interface by EPMA analysis, and the incorporation depth increased with prolonged immersion. The continuous release of ions from the S-PRG sealer and their subsequent incorporation by root canal dentin were confirmed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
