Abstract
A micro X-ray fluorescence-based approach for the chemical characterization of spent printed circuit boards (SPCB) from mobile phones was applied. More in detail, twelve spent mobile phones were grouped in three clusters depending on brands, models and release year and a study to evaluate the technological evolution of SPCBs over time was carried out. Precious and dangerous elements were investigated and some differences between samples belonging to the different groups were detected. For instance, the distribution of gold on the SPCB layers was more widespread for the older analyzed samples, and a smaller and smaller quantities of bromine and lead were detected in the more recent models in accordance with the Restriction of Hazardous Substances Directive 2002/95/EC. The analysis of SPCB composition can help to correctly manage such a complex waste, maximizing the recovery of base, critical and precious metals and considering the possible presence of harmful elements to be carefully managed. The experimental results showed as, through the proposed approach, it is possible to obtain chemical elements distribution maps of SPCBs surface, thus allowing to define optimal strategies for their further handling (i.e. classification) and processing (i.e. critical/precious metals recovery).
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