Abstract
Aluminium/poly(n-butyl methacrylate)/aluminium pattern thin films of different thickness were fabricated through plasma polymerization technique and their DC electrical characterization was conducted with a view of better understanding of the electrical charge transport mechanism. The current density—voltage and current density—film thickness characteristics of fabricated thin films of different thickness indicated that the dominant conduction mechanism in the higher voltage region is space charge limited conduction. The estimated carrier mobility, trap density and free carrier density decreased with the increase of thickness of the prepared thin films.
Published Version
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