Evaluation of Diode laser (940 nm) irradiation effect on microleakage in class V composite restoration before and after adhesive application

Abstract

Introduction: Nowadays, the main focus of dental studies is on adhesive dental materials; since clinical long-term success of bonded restorations depended more on marginal microleakage minimization. So, the aim of this study was Evaluation of Diode laser irradiation effect on microleakage in class V composite restoration before and after adhesive application. Materials and methods: In this in vitro-experimental study, standard class V cavity was prepared on lingual and buccal surfaces of 60 premolar teeth. For evaluation of microleakage, 60 teeth were divided randomly into four groups A, B, C, D (n=15): A) primer + adhesive (Clearfil TM SE Bond), B) primer + Diode laser + adhesive (940nm wave-length, 21J total energy, 0.7W power, 30s irradiation time) C) primer + adhesive + Diode laser D) primer + Diode laser + adhesive + Diode laser. Then, restoration was completed by Z250 composite. For data analyzing, we used SPSS 16 software. For statistical analysis, we used Non-parametric Kruskal-Wallis & Mann-Whitney tests at 0.05% significance level. Results: According to non-parametric Kruskal-Wallis test, microleakage scores had not significant difference before and after laser irradiation on gingival margins (p=0.116). But, in occlusal margins the results were significant among the groups (p=0.015). Also according to non-parametric Mann-Whitney tests among the occlusal microleakage scores, group B and D (Diode laser irradiation after primer and Diode laser irradiation after primer and adhesive) showed significant results. Conclusion: This study findings showed that in 6th generation adhesives, Diode laser irradiation on self-etch primer before bonding have significant effect on reduction of occlusal marginal microleakage in class V cavities although there was no significant positive effect of Diode laser on gingival margins.