Abstract
Structural defects in electron-irradiated graphene oxide (GO), and multi-walled carbon nanotubes (MWCNT) were investigated by Raman. All the samples were irradiated with a 10 MeV electron-beam to 200 kGy. XRD, FTIR, FESEM, HRTEM, XPS and Raman spectroscopy analyses were carried out. To estimate the magnitude of induced defects in the samples, the ID/IG parameter was considered in various absorbed doses. The XPS analysis exhibited a 2.5%, and 3.2% increase in the carbon to oxygen ratio for MWCNT, and GO at 50, and 100 kGy, respectively. Results of Raman spectroscopy to determine D, and G bands at characteristic wavelengths showed a good agreement with the literature data. Also, for GO, the long-term stability of the irradiation-induced defects was investigated after four months, which revealed that maybe crosslinking of the carbon atoms at high-doses greater than 100 kGy could freeze the induced defects over time.
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