Abstract
Proton-irradiation results ranging from 17 MeV to 100 MeV are presented for silicon commercial off-the-shelf charge-coupled devices. Mean degradation of the dark current and the dark-signal nonuniformity are analyzed. A good linearity between proton-nonionizing energy loss and the mean dark-signal degradation is obtained. A method to determine parameters required by the Marshall method prediction is proposed. This method is based on the three experimental and theoretical moments. An excellent agreement is obtained with the experimental degradation. The last step is to perform the method on a continuous proton spectrum. Prediction of dark-signal behavior is in a good agreement with experimental data.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.