Abstract
The evaluation of the degradation on a COTS linear Charge Coupled Device (CCD) induced by total ionizing dose (TID) radiation damage was presented. The radiation experiments were carried out at a60Coγ-ray source. The parameters of DALSA’s linear CCD were measured at the CCD test systems as the EMVA1288 standard before and after the radiation. The dark current, dark signal nonuniformity (DSNU), photo response nonuniformity (PRNU), saturation output, full-well capacity (FWC), quantum efficiency (QE), and responsivity versus the TID were analyzed. The behavior of the tested CCD had shown a remarkable degradation after radiation. The degradation mechanisms of the CCD induced by TID damage were also discussed.
Highlights
Charge Coupled Device (CCD) has been extensively used in imaging, signal processing, and serial memories, especially for particle detection and space applications [1, 2]
It is known that the increase of dark current in a CCD is mainly caused by total ionizing dose (TID) radiation damage, so we will focus on the TID radiation-induced increase of dark current
The dark current increases with increasing TID, which is due to the increase in density of traps induced by TID damage
Summary
Charge Coupled Device (CCD) has been extensively used in imaging, signal processing, and serial memories, especially for particle detection and space applications [1, 2]. The increase of dark current caused by radiation induces the decrease of the effective signal and the imaging quality. The decrease of saturation output and FWC caused by radiation induces the decrease of imaging quality such as the dynamic range (DR) and the signal-to-noise ratio (SNR). The decrease of the QE and responsivity caused by radiation induces the decrease of the photon-sensitivity of a CCD. Wang et al have studied the degradation of the saturation output signal voltage of the array CCDs caused by the TID radiation damage [6]. The evaluation of the degradations on DALSA’s linear CCDs induced by total ionizing dose (TID) damage is important to the satellite designers. The research reported examines the experiments of TID radiation effects on DALSA’s linear CCDs. The degradations of the parameters induced by TID damage were evaluated. The degradation mechanisms of the CCD induced by TID damage were analyzed in detail
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