Abstract
The present paper aims to develop a uniform procedure of estimating uncertainty components in VNA measurements whether in complex or linear units. The individual response of each uncertainty components have been studied in the frequency range 1 to 18 GHz, which are applicable for one-port and two-port measurements. The Vector network analyser (VNA) measurements are performed to assign an overall uncertainty for the respective measuring parameter in terms of comp lex and linear units for coaxial step attenuator, fixed attenuator and mis match. These measurements are then verified through the primary and transfer standards of the attenuation and impedance parameters and thus the traceability of the VNA measurements is established. Finally, the outcome of co mplete study has been presented as VNA measurements based new calibrat ion and measurement capabilit ies (CM Cs) for NPL, India. It has shown that the final combined uncertainty is found same or nearby by obtaining from uncertainty components either in complex or in linear units. Thus, this paper reports the estimation of VNA measurement uncertainties for various parameters as per the requirements of IS O/IEC 17025:2005 standard.
Highlights
Tod ay, th e b roadb and measu rement o f micro wav e parameters is carried out in terms of co mplex S-parameters using a vecto r net wo rk an aly zer (VNA ) at rad io and micro wave frequencies
A Vector network analyser (VNA) characterizes the behaviour of linear networks quickly, accurately, and comp letely over broad frequency ranges by measuring its transmission and reflection coefficients in terms of scattering parameters or S-parameters of the device -under-test (DUT)
This paper presents t he steps and methods for the utilization of VNA system to calibrate of one-port and two-port components and in the metrology applications
Summary
Tod ay , th e b roadb and measu rement o f micro wav e parameters is carried out in terms of co mplex S-parameters using a vecto r net wo rk an aly zer (VNA ) at rad io and micro wave frequencies. The influences of the non-ideal calibration standards on the complex S-parameters measurement in the real/imag inary and magnitude/phase formats and sensitivity coefficients for various calibrat ion techniques have been analyzed and on their uncertainties have been studied[11,12,13,14]. There is still a large gap between NMI and other level-II laboratories in evaluation of uncertainty in VNA measurements and establishing its traceability in accordance with ISO/IEC 17025:2005. For bridging this gap, this paper presents t he steps and methods for the utilization of VNA system to calibrate of one-port and two-port components and in the metrology applications. The possibility of getting the same uncertainty value will be explored, while estimating the uncertainties using various forms for the single measurement value
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