Abstract
The Meaning-Time-To-Failure (MTTP), also known as Electromigration Analysis is an estimation of product life. Light-Emitting Diodes (LEDs) are usually driven by constant current switched-mode power supplies, which are invented early than LEDs for lighting applications. While LEDs themselves are extremely reliable and have a long lifetime, the electronic LED drivers in experiment usually fail due to overheating causing Printed Circuit Boards (PCBs) explosion, inability provide current/voltage input to the LEDs over their whole lifetime. This paper proposes a numerical simulation method to predict fault location on PCB of LED driver based on 2-way coupling electro-thermal multiphysic analysis, then applies the analytic models to calculate the time to failure of the points on PCB of LED drivers. The procedures can be applied to assist managers in assessing risk and making LED-based lighting system reliability decisions.
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