Abstract
Transient Radar Method (TRM) was recently proposed as a novel contact-free method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction method allows sub-wavelength thickness measurements around .
Highlights
It hardly needs any saying that microwave, millimeter, and THz waves are step-by-step penetrating the application fields of non-destructive testing (NDT)
Measurement Methodology In Transient Radar Method (TRM), the sample under test (SUT) in free space is periodically illuminated with a monochromatic electromagnetic continuous wave (EMCW) and the time-dependent reflected trace is captured by a narrow-band receiver
Periodic illumination is obtained by on-off keying a Single Pole Single Throw (SPST) switch arranged between the Continuous Wave (CW) generator and the SUT [22,23]
Summary
It hardly needs any saying that microwave, millimeter, and THz waves are step-by-step penetrating the application fields of non-destructive testing (NDT). A special challenge is still the combined retrieval of the complete geometric and electromagnetic characteristics of Multilayer Structures (MLS) in a completely blind way Solutions proposed for this important challenge in NDT show one or more disadvantages, such as the time-consuming process, a need for higher frequency resolution, a need for larger frequencies up to the THz range, stability [5], increased bandwidth for creating ultra-narrow pulses in the time domain or sweeping frequency in spectroscopy, etc. The technique is synthetic aperture (SA) imaging, which is based on FMCW radar, which requires ultra-wide frequency range This method requires prior knowledge of the material under test to increase its accuracy [14].
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