Abstract
In this article, the arc erosion behaviour of high-purity Ti3SiC2 in vacuum was investigated by x-ray diffraction, scanning electron microscope, energy dispersive x-ray spectroscopy, and micro-Raman spectroscopy. From the results obtained, Ti3SiC2 is unstable due to the high energy intensity and high temperature of the vacuum arc. The dissociation of Ti3SiC2 takes place at the sample surface, resulting in the formation of solid TiCx and gaseous Si. TiCx is ejected from cathode to the surface of anode while Si is evaporated to the vacuum chamber. The micro-Raman results reveal that small amounts of carbon appeared as a by-product of the dissociation of Ti3SiC2, indicating that the Ti–C bonding is broken down under the vacuum arc.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
