Abstract
We demonstrate epitaxial lattice-matched Al0.89Sc0.11N/GaN 10 and 20 period distributed Bragg reflectors (DBRs) grown on c-plane bulk n-type GaN substrates by plasma-assisted molecular beam epitaxy. Resulting from a rapid increase in in-plane lattice coefficient as scandium is incorporated into AlScN, we measure a lattice-matched condition to c-plane GaN for a Sc content of just 11%, resulting in a large refractive index mismatch Δn greater than 0.3 corresponding to an index contrast of Δn/nGaN = 0.12 with GaN. The DBRs demonstrated here are designed for a peak reflectivity at a vacuum wavelength of 400 nm, reaching a reflectivity of 0.98 for 20 periods. It is highlighted that AlScN/GaN multilayers require fewer periods for a desired reflectivity than other lattice-matched Bragg reflectors such as those based on AlInN/GaN multilayers.
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