Abstract

We demonstrated epitaxial growth of GaN (0001) films on nearly lattice-matched Hf (0001) substrates by using a low-temperature (LT) epitaxial growth technique. High-temperature growth of GaN films results in the formation of polycrystalline films due to significant reaction at GaN/Hf heterointerfaces, while LT-growth allowed us to suppress the interfacial reactions and to obtain epitaxial GaN films on Hf substrates with a GaN112̄0//Hf112̄0 in-plane orientation. LT-grown GaN films can act as buffer layers for GaN growth at high temperatures. The interfacial layer thickness at the LT-GaN/Hf heterointerface was as small as 1 nm, and the sharpness of the contact remained unchanged even after annealing up to approximately 700 °C, which likely accounts for the dramatic improvement in GaN crystalline quality on Hf substrates.

Highlights

  • We demonstrated epitaxial growth of Gallium nitride (GaN) (0001) films on nearly lattice-matched Hf (0001) substrates by using a low-temperature (LT) epitaxial growth technique

  • Hf substrates have not been a practical candidate for GaN films because of the difficulty in GaN epitaxial growth, which is associated with significant interfacial reactions during high-temperature growth above 1000 ◦C in conventional metal-organic chemical vapor deposition (MOCVD).[7]

  • We have investigated the feasibility of epitaxial growth of GaN films on matched Hf (0001) substrates with small lattice mismatches using the low-temperature (LT) growth technique involving pulsed excitation deposition (PXD)

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Summary

Introduction

We demonstrated epitaxial growth of GaN (0001) films on nearly lattice-matched Hf (0001) substrates by using a low-temperature (LT) epitaxial growth technique. Epitaxial growth of GaN films on nearly lattice-matched hafnium substrates using a low-temperature growth technique

Results
Conclusion

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