Epitaxial growth and characterization of La2Zr2O7 multilayers on biaxially textured NiW substrate by chemical solution deposition under highly reducing conditions

Abstract

The paper presents the growth and characterization of highly textured La2Zr2O7 (LZO) multilayer coatings on Ni–5at.%W (NiW) biaxially textured substrates by chemical solution deposition (CSD) under highly reducing conditions (Ar+12%H2) in order to protect the metallic substrate from oxidation. The coating solution consists in a stoichiometric mixture of lanthanum and zirconium acetylacetonates dissolved in an excess of propionic acid. The precursor chemistry was studied by means of infrared spectroscopy, thermogravimetric–differential thermal analyses, Raman spectroscopy and X-ray diffraction carried out on the precursor powder. The as-grown multilayer LZO coating exhibits a sharp in-plane and out-of-plane texture, with the full-width-at-half-maximum of the ω-scans and φ-scans of about 7.2° and 8.0°, respectively, close to that of the NiW substrate. The volume fraction of the c-axis oriented grains from the top layer of the coating increases with the number of layers. The LZO coating exhibits a smooth and crack-free surface, appropriate for the further epitaxial growth of a seed layer for the YBa2Cu3O7−x (YBCO) deposition. Transmission Electron Microscopy was used to investigate the microstructure of the CSD LZO thin films deposited on flexible NiW substrates. A high density of nanovoids, with a size ranging between 10 and 30nm, was observed in the LZO layers. YBCO films epitaxially grown by pulsed laser deposition on the CSD LZO buffer layer exhibit critical current densities, Jc, close to 1.6MA/cm2 at 77K and self-field and zero resistance critical temperature (Tc(R=0)) of 90.3K.