Abstract
An unexpected interface effect for the sampling depth of elastic peak electron spectroscopy (EPES) in applications to the overlayer/substrate system has been found. The sampling depths expressed as an information depth (ID) for Au/Ni and Rh/Al systems and selected energies in the range 200–10,000 eV were obtained from Monte Carlo (MC) simulations for typical for EPES cylindrical mirror analyser (CMA) configuration. It turned out that deep minimum in the ID dependence on the interface depth can exist. For example, for Rh/Al system at the energy of 2000 eV the ID can be smaller by a factor of two than the ID for the system elements. This effect can be explained in terms of the differential cross sections.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Electron Spectroscopy and Related Phenomena
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
