Environmental SEM investigation on surface defects in 0.92Pb(Zn 1/3Nb 2/3)O 3–0.08PbTiO 3 single crystal

Abstract

In this paper, the technique of environmental scanning electron microscopy (ESEM) has been employed to investigate the surface defects of the (1 1 1) appearing face in 0.92Pb(Zn 1/3Nb 2/3)O 3–0.08PbTiO 3 (PZN–8%PT) crystals. From the ESEM images, we succeeded in observing and studying the growth hillocks and etch pits, low-angle grain boundaries, and sub-grain boundaries in (1 1 1) face, which were related to the generation of dislocation and stacking faults, respectively. On the other hand, an image of a unique multi-layer lamellar structure and fine step structure obtained in the (1 1 1) face reveals that the dominant fast growth mechanism of PZN–8%PT crystal grown by the flux method is a sub-step mechanism, unlike the screw dislocation growth mechanism.