Abstract
Bulk samples of (Bi1-xInx)2 Te 2.7 Se0.3 (x = 0.00, 0.02, 0.04) were prepared by solid state reaction technique. Powder X-ray diffraction pattern confirms that the polycrystalline samples have hexagonal structure with spacegroup R3‾m. Surface morphology shows a reduction in porous behaviour of the material due to co-doping. Energy dispersive X ray analysis demonstrates the elements present in the sample. Electrical resistivity has shown a quasi-degenerate semiconducting behaviour. Hall effect and Seebeck coefficient confirmed that all the samples are n-type. There is a decrease in thermal conductivity with the variation in dopant concentration. The maximum ZT was found to be 0.6 at 350 K for the sample (Bi0.98In0.02)2 Te 2.7 Se0.3 which is about 5 times that of the pristine sample Bi2Te3.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
