Abstract
Bi2S3 thin films were grown by successive ionic layer adsorption and reaction method (SILAR) onto the glass substrates at room temperature. The as prepared thin film were annealed at 250°C in air for 30min. These films were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM) and electrical measurement systems. The X-ray diffraction patterns reveal that Bi2S3 thin film have orthorhombic crystal structure. SEM images showed uniform deposition of the material over the entire glass substrate. The optical energy band gap observed to be decreased from 1.69 to 1.62eV for as deposited and annealed films respectively. The I–V measurement under dark and illumination condition (100W) show annealed Bi2S3 thin film gives good photoresponse as compared to as deposited thin film and Bi2S3 thin film exhibits photoconductivity phenomena suggesting its useful in sensors device. The thermo-emf measurements of Bi2S3 thin films revealed n-type electrical conductivity.
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