Enhancement of electrochemical and thermal bonding reliability by forming a Cu3Sn intermetallic compound using Cu and Sn–58Bi

Abstract

Cu–Cu bonding was successfully achieved through the transient liquid phase sintering (TLPS) bonding method using Cu and an eutectic Sn–Bi alloy. The bonding process was performed for total bonding process time of 2 h under a pressureless condition in air. The bonding temperature was 220 °C considering that the Cu6Sn5 intermetallic compound (IMC) and Bi react at 195.9 °C to transform into Cu3Sn and a liquid. The shear strength of Cu-70(Sn–58Bi) was approximately 22.06 MPa with the formation of the Cu3Sn. The residual eutectic Sn–Bi structure remained at Cu-90(Sn–58Bi), and the voids were largely observed at Cu-50(Sn–58Bi). In case of Cu-70(Sn–58Bi) and Cu-50(Sn–58Bi), the remelting temperature increased to 270 °C by the IMC reaction between Cu and Sn. On the other hand, the remelting temperature of Cu-90(Sn–58Bi) joint remained at 139 °C due to residual eutectic Sn–Bi structure. The salt spray test was conducted at 35 °C under the 5% NaCl condition for 24, 48, and 96 h to evaluate the bonding reliability under the salt spray condition. The corrosion behavior was evaluated using the electrochemical impedance spectroscopy measuring method. In addition, the thermal bonding reliability was investigated through a high-temperature storage test at 200 °C for 100, 500, and 1000 h. Analysis results of the experiment showed that the electrochemical and thermal bonding reliabilities were improved with the Cu3Sn formation owing to its high resistance properties under the salt spray and high-temperature conditions.