Enhanced sensitivity of Z-scan technique by use of flat-topped beam

Abstract

Based on the Huygens–Fresnel diffraction integral method, we report a theoretical investigation on the closed-aperture Z-scan technique by using the flat-topped beam. The sensitivity of the flat-topped beam Z-scan technique, which can be enhanced with the increase of the flatness order N for the flat-topped beam, is greatly higher than of the Gaussian beam. Some salient characteristics of the flat-topped beam Z-scan traces are addressed. The flat-topped beam Z-scan technique for characterizing the instantaneous nonlinearity is also presented.