Abstract
We report strong enhancement (approximately 10(3)) of the spontaneous Raman scattering from individual silicon nanowires and nanocones as compared with bulk Si. The observed enhancement is diameter (d), excitation wavelength (lambda(laser)), and incident polarization state dependent, and is explained in terms of a resonant behavior involving incident electromagnetic radiation and the structural dielectric cross section. The variation of the Raman enhancement with d, lambda(laser), and polarization is shown to be in good agreement with model calculations of scattering from an infinite dielectric cylinder.
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