Abstract
In today's global traditional energy shortage environment, developing renewable and environmental-friendly energy has become a trend. In this work, the (1-x)Na0.5Bi0.5TiO3-xSr0.7Bi0.2TiO3 ((1-x)NBT-xSBT, x=0.2, 0.3, 0.4, and 0.5) relaxor ferroelectric thin films are grown on Pt/Si/SiO2 substrate via the sol-gel method. The structure, dielectric properties, energy density, thermal stability, frequency stability, and fatigue endurance for long-term stability of the (1-x)NBT-xSBT thin films are studied systematically. The experimental results demonstrate that the NBT-0.5SBT thin film exhibits an excellent discharge energy density (Wrec ~35.014 J/cm3) and efficiency (η ~73.8%) under 3200 kV/cm at room temperature (RT). More importantly, the corresponding thin film display superior the thermal stability (20–140 °C), frequency stability (102–104 Hz), and fatigue endurance for long-term stability (104 st). Therefore, this contribution will provide a convenient and efficient way for preparing high-performance dielectric capacitors for application in power pulse systems.
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