Abstract
The diffraction of γ-rays by mosaic Si crystals with thicknesses of 20, 40, and 80 mm and by a 2-mm-thick perfect Si crystal in a transmission Laue geometry was measured using a high-flux 60Co source with an intensity of 2.2 TBq. The measured diffraction intensities at 1.17 and 1.33 MeV using 40- and 80-mm-thick mosaic crystals were enhanced by a factor of approximately 8.6 compared with those of the perfect Si crystal. The integrated reflectivity is well described in statistical dynamical theory by taking into account γ-ray absorption inside the crystals.
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