Abstract
This paper reports enhanced absorption in laser-crystallized Si thin films on abrade-textured glass. The Si film on textured glass has large high-quality grains of several hundred micrometers in width and up to several centimeters in length. A combination of glass texturing, rear Si texturing, white paint rear reflector, and front moth-eye antireflection foil on a 10-μm-thick Si film (on $\text{SiO}_{x}/\text{SiN}_{x}/\text{SiO}_{x}$ intermediate layer) shows a large broadband absorption enhancement with potential short-circuit current densities up to 29.5 mA/cm2 (26.1% enhancement as compared with a planar reference).
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