Energy-filtered electron-diffracted beam holography

Abstract

A method of energy-filtered electron holography is described where any two electron-diffracted beams can be interfered using an electron biprism. A Gatan image filter is used to select the energy loss of the electrons produced in the holograms. Gallium arsenide is used as the TEM specimen. This method of microscopy confirms that fringes extending beyond a limiting aperture were due to inelastically scattered electrons and specifically electrons scattered from the bulk plasmon. The degree of coherence of the zero-loss and energy-loss electrons were high and measured to be ∼0.3, which was maintained even for the high energy-loss electrons up to 100 eV. Future systematic studies using this method should help understand the Stobbs factor and contribute to the development of quantitative high-resolution electron microscopy.