Energy dependence of transport parameters derived from correlated variations in the thermoelectric power and temperature coefficient of resistivity of polycrystalline metal films

Abstract

Literal and general expressions of the thermoelectric power (TEP) of polycrystalline metal films are derived in the framework of the recently proposed three-dimensional model of conduction. Theoretical plots of the thickness dependence of film TEP are given and show that the TEP of infinitely-thick polycrystalline film markedly depends on the grain parameter. These theoretical results, as well as the general relation which expresses the film TEP in terms of the film temperature coefficient of resistivity (TCR), suggest two convenient ways for graphically determining the energy dependence of the bulk mean free path and the Fermi surface area.