Abstract

We report the fabrication and device analysis to enable high performance/low-temperature complementary thin-film transistors (CTFTs) with 6, 13-Bis(triisopropylsilylethynyl)-pentacene (TIPS-pentacene) and cadmium sulfide (CdS). Isolated transistors are first studied and then integrated in a fully patterned CTFT structure. N-type TFTs were fabricated using atomic layer deposition HfO2 as gate dielectric, followed by a CdS film deposited by chemical bath deposition at 70 °C. A novel approach that uses a parylene-C hard mask to avoid damage to the CdS n-type semiconductor is introduced. Also, a comparison between the n-type transistor performance using two different metals (Au and Al) for source-drain electrodes is presented. P-type transistors were fabricated using a novel approach that combines photolithography and ink-jet printing processes. TIPS-pentacene is deposited with inkjet printing in the active channel well, which is photolithographically defined. The p-type TFT mobilities ranged from 1.2×10-3 to 1.5×10-2 cm2/V-s, whereas for n-type TFTs mobilities were ~ 10 cm2/V-s. CTFTs with a maximum processing temperature of 150 °C are demonstrated. Inverters with gains of 17 were achieved. This fabrication process is compatible with large area and low-cost technologies for flexible electronics applications.

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