Empirical Model of Flicker in Silicon Light Valves

Abstract

We have performed systematic characterizations of flicker in silicon light valves. It was found that temperature was the most important factor associated with flicker. Temperature could assist conduction mechanisms in silicon light valves and enhance the flicker accordingly. The major conduction mechanisms of flicker in silicon light valves were residual DC charge on the silicon surface, the voltage holding capability of a liquid crystal cell, the voltage holding capability of a silicon panel, light leakage and parasitic capacitor coupling. Major causes of these flicker mechanisms were identified through systematic characterizations. An empirical model of flicker was proposed with quantitative experimental data and theories. Among these conduction mechanisms, temperature could boost the voltage holding capabilities of a silicon panel to become the most dominant cause of flicker when the temperature was above 40°C. At temperatures below 30°C, the other four conduction mechanisms contributed to the flicker in different ways. Minimization of flicker could be achieved through materials and device optimization.