Abstract
In this paper, deep ultraviolet laser photo emission and thermal emission electron microscopy (DUV-PEEM/TEEM) with high resolution have been used to carry out research on M-type cathode and a new Sc- type impregnated dispenser cathode. The micro region photo emission electron images and thermal emission electron images of cathodes have been obtained. The results show that high emission regions of the new Sc-type impregnated dispenser cathode are almostly distributed on the edge of the particles and the tiny surface of a few tungsten particles, which have high intensity contrasted with the surrounding areas. For M-type cathode, the high emission regions are concentrated on the matrix pores, and it is not very uniform as we supposed.
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