Emerging tunnel FET and spintronics-based hardware-secure circuit design with ultra-low energy consumption

Abstract

Present complementary metal–oxide–semiconductor (CMOS) technology with scaled channel lengths exhibits higher energy consumption in designing secure electronic circuits against hardware vulnerabilities and breaches. Specifically, CMOS sense amplifier-based secure differential power analysis (DPA) countermeasures at scaled channel lengths show large energy consumption, with increased vulnerability. Additionally, spin-transfer torque magnetic tunnel junction (STT-MTJ) and CMOS-based logic-in-memory (LiM) cells demonstrate high energy consumption due to the large write current requirement of the STT-MTJ and poor MOS device performance at scaled channel lengths. This paper for the first time leverages emerging tunnel field effect transistor (TFET) steep-slope device characteristics and compatible non-volatile STT-MTJ devices for enhanced hardware security with ultra-low energy consumption at lower supply voltages. TFET-based sense amplifier-based logic (SABL) gates are proposed that achieve 3× lower energy consumption than the Si FinFET SABL designs. Further, utilizing TFET SABL gates, a TFET PRIDE S-box is designed that exhibits higher DPA resilience with 3.2× lower energy consumption than the FinFET designs. With the resulting lower static power consumption, TFET SABL-based cryptosystems are thus less vulnerable to static power side-channel attacks. Additionally, the proposed STT-MTJ and TFET LiM gates achieve 4× lower energy consumption than the STT-MTJ and FinFET designs. Lastly, these gates are explored in a logic encryption/locking technique that shows 3.1× lower energy consumption than the STT-MTJ and FinFET-based design.