Abstract

The formation of a Ball Grid Array (BGA) solder joint is critical for a BGA package where typically a flux deposition process is used. Reflowing solder spheres to solderable pads on the bottom of substrates in standard BGA, FCBGA, CSP, and similar packages is considered to be a trivial step: a specialized BGA flux is usually pin-transferred onto the pads, followed by balldrop onto the substrate. However, with the increasing complexity and number of assembly processes taken prior to this final step, the formation of a reliable final joint is far from certain. In order to eliminate variability, many OSATs and ODMs use the so-called “two step” (double fluxing) approach, which is comprised of the non-value-added extra processes of prefluxing, reflowing, cleaning, and drying substrates immediately prior to the final flux-based ball-attach process. This paper details the sequence of processes seen in typical FCBGA assembly, and examines the effects of each set of prior processes on the solderability of the final pad. The introduction of a “one-step” pin-transfer ball-attach flux is shown to be a means of reducing both process cost and time, and also reducing the risk of increased warpage in the finished package. The paper also investigates the solderable surface and metallurgy of the substrate pad. The variety of new and emerging failure modes for the BGA process as well as the different testing methods for the materials will also be discussed.

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