Embedding N-Detect Test Set into Controlled Bits Stream

Abstract

N-detect testing suffers from the drawback with its test set size and test application time. A Build-In Self-Test (BIST) N-detect test patterns generation method based on controlled linear shifter is proposed, which embeds test set into the controlled bits stream and provide high defect coverage with low storage area overhead and test application time. In this method, corresponding N test patterns are generated for each fault, by using the bits which are directly stored in ROM to control the first bit of the linear shifter, dynamically generate the complete N-detect test set. Simulation results for benchmark circuits show that the proposed method with power consumption considering provides considerably lower area overhead, shorter test application time and higher transition-fault coverage compared to other recently-published methods.