EM-Based On-Chip Aging Sensor for Detection of Recycled ICs

Abstract

Counterfeiting integrated circuits (ICs), especially recycled ICs, have become a major security threat for commercial and military systems. This paper proposes a new lightweight on-chip aging sensor, which is based on electromigration-induced aging effects for fast detection and prevention of recycled ICs. Compared to other existing aging sensors, the proposed sensor can provide more accurate prediction of the chip usage time with smaller area footprints, as demonstrated by the statistical simulation results presented in the article.