Elucidating the nanoscale origins of organic electronic function by conductive atomic force microscopy

Abstract

Electronic and optoelectronic devices comprising organic materials are highly promising for mechanically flexible and low-cost applications. In recent years, conductive atomic force microscopy (C-AFM) has played a significant part in deciphering the nanoscopic and mesoscopic origins of organic electronic function. C-AFM is uniquely capable of measuring local electrical properties with nanoscale resolution; moreover, in conjunction with complementary atomic force microscope modes, C-AFM enables simultaneous mapping of nanoscale structure and electrical function. This feature article highlights recent progress in applying C-AFM to characterize organic electronic systems including self-assembled monolayers, graphene and related materials, organic semiconductors, and organic photovoltaic heterojunctions.