Abstract
The authors present the results of the ellipsometric characterization of thin layers of bismuth and aluminum oxide deposited over the waist of a tapered optical fiber by pulsed laser deposition. The characteristics of the deposits are studied by spectroscopic ellipsometry. From the effective thicknesses determined by the ellipsometric characterization, it is shown by simulations that surface plasmon resonances (SPRs) can occur in the fiber device, and it is demonstrated experimentally. These results show the feasibility of employing bismuth as a plasmonic material in SPR fiber sensors based on doubly-deposited uniform-waist tapered optical fibers, which show excellent performance and versatility.
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Schedule a callMore From: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
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