Elimination of the background nonuniformity of the experimental contrast of single-crystal structural defects

Abstract

The procedure for eliminating the background nonuniformity of the polarization-optical contrast of a 6H-SiC single crystal by digital processing based on the frequency analysis of images is considered in this paper. This procedure involves separating the signal produced only by the background nonuniformity and subtracting it from the initial experimental contrast during the wavelet processing. It is shown that, in the analyzed contrast, it is possible to decrease the intensity fluctuation induced by the aliasing phenomenon. A good detailed elaboration of the images of structural defects, including low-frequency specific features, and a good correspondence to the theoretical contrast calculated using the modified Indenbom—Chamrov equations were obtained as a result of digital processing.