Abstract
We report on the investigation of the electrothermal behavior and the terahertz (THz) emission properties of two nearby Bi2Sr2CaCu2O (BSCCO) intrinsic Josephson junction stacks, using a combination of electric transport and THz emission measurements plus low temperature scanning laser microscopy. We start with a compact BSCCO stack (placed in a z-shaped structure between two BSCCO electrodes) with lateral dimensions of and height, consisting of about 480 junctions. After characterization, a 200 nm wide slit was introduced by focused ion beam milling, splitting the stack into two halves connected by continuous superconducting electrodes. In a third step, the upper electrode was also split, leading to a structure where the two stacks can be biased separately. In all configurations hot-spot formation was observed. Despite the separation into two stacks only a single hot spot formed, which, depending on the bias condition, could either be located in one of the stacks or extend into both stacks with its center in the slit. In none of the structures it was possible to achieve mutual synchronization of the two stacks, indicating that additional synchronizing elements or the presence of a base crystal as for mesa structures may be necessary for the operation of parallel array structures.
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