Abstract
In this paper, a simple device under electrostatic discharge (ESD)event is considered. This work presents a simple experimental and simulated setup to measure ESD‐induced voltage to trace on a printed circuit board (PCB) when ESD current is injected directly onto the lumped element. Based on an ESD immunity test platform and ESD full‐wave model, the waveform of coupling voltage, which induced on a PCB, are measured at different discharging position. The voltage waveform of resistor on PCB with chip and without chip are compared to analyze the difference in two cases. The paper proposes a method that compares the measured results of experiment with simulation of full‐wave model. It is found that the results of simulation and experiment is in good match on the whole.
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