Electrorecrystallization of Invar 36 alloy

Abstract

The recrystallization of the Invar 36 alloy after current stressing, at 8000–18000 A/cm2, was investigated with X-ray diffraction, electron back scattered diffraction and magnetic hysteresis. The electrical resistivity of the alloy increased by 10 % after electrical current stressing, while the microhardness did not show significant change. The average grain size was slightly refined, yet the grain size uniformity was improved by current stressing. The crystal orientation map shows the transition trend from (001) to (101) after current stressing. The pole figure analysis indicated that the Cube texture and the annealed twin were degraded after current stressing. Current stressing resulted in the transition of the Cube texture to Copper texture. The magnetic hysteresis analysis showed the structure did not exhibit much change to influence the coercive force. The increase in electrical resistivity was ascribed to the variation in texture and the possible increment of dislocation density as indicated by the Kernel Average Misorientation and X-ray diffraction results.